Reliability (semiconductor): Revision history

6 March 2024

• curprev 08:3908:39, 6 March 2024‎ Onel5969 talk contribs‎ m 9,845 bytes +23‎ Disambiguating links to Timing analysis (link changed to Static timing analysis) using DisamAssist. undo

7 October 2023

• curprev 08:1708:17, 7 October 2023‎ Jovana lukina talk contribs‎ 9,822 bytes −9‎ Minor edit undo Tag: Visual edit

6 October 2023

• curprev 15:5915:59, 6 October 2023‎ Jovana lukina talk contribs‎ 9,831 bytes −56‎ Removed editing mistake undo Tag: Visual edit
• curprev 15:5915:59, 6 October 2023‎ Jovana lukina talk contribs‎ m 9,887 bytes +256‎ Provided a definition of what reliability is undo Tag: Visual edit

24 August 2023

• curprev 19:4219:42, 24 August 2023‎ Ira Leviton talk contribs‎ 9,631 bytes −5‎ Fixed a reference. Please see Category:CS1 errors: unsupported parameter. undo

26 June 2022

• curprev 22:4622:46, 26 June 2022‎ Citation bot talk contribs‎ 9,636 bytes +16‎ Add: s2cid. | Use this bot. Report bugs. | Suggested by AManWithNoPlan | #UCB_CommandLine undo

21 June 2021

• curprev 01:0901:09, 21 June 2021‎ OAbot talk contribs‎ m 9,620 bytes +17‎ Open access bot: doi added to citation with #oabot. undo

18 June 2021

• curprev 02:4802:48, 18 June 2021‎ AnomieBOT talk contribs‎ m 9,603 bytes +15‎ Dating maintenance tags: {{Full}} undo
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• curprev 02:2702:27, 18 June 2021‎ Chris Capoccia talk contribs‎ 9,494 bytes +1,256‎ No edit summary undo

14 June 2021

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13 June 2021

• curprev 04:0904:09, 13 June 2021‎ Wtshymanski talk contribs‎ 8,099 bytes −249‎ undue; this is a very minor part of this paper, I expect. Undid revision 1028106532 by Mohsenakbari1221 (talk) undo Tag: Undo

11 June 2021

• curprev 22:0222:02, 11 June 2021‎ Mohsenakbari1221 talk contribs‎ 8,348 bytes +249‎ No edit summary undo Tag: Reverted

20 October 2020

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18 October 2020

• curprev 07:2807:28, 18 October 2020‎ Citation bot talk contribs‎ 8,097 bytes −4‎ Alter: title. | You can use this bot yourself. Report bugs here. | Suggested by Abductive | Category:Semiconductor device fabrication | via #UCB_Category 102/170 undo

21 June 2020

• curprev 07:3007:30, 21 June 2020‎ Gracefool talk contribs‎ 8,101 bytes +23‎ →‎See also: Transistor aging undo

20 February 2020

• curprev 08:0208:02, 20 February 2020‎ Jabberjaw talk contribs‎ 8,078 bytes −4‎ copy edit/clean up; MI undo Tag: AWB

14 February 2020

• curprev 09:1809:18, 14 February 2020‎ 163.1.246.246 talk‎ 8,082 bytes −1‎ Added links to the article on derating, and changed list separators in Introduction to semicolons. undo

14 October 2019

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11 January 2018

• curprev 16:3016:30, 11 January 2018‎ HowardRoberts talk contribs‎ m 8,239 bytes −3‎ →‎"Wafer test" does not test the packaged device... corrected to "final test" undo

1 November 2017

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20 October 2017

• curprev 21:3521:35, 20 October 2017‎ 力 talk contribs‎ 8,470 bytes +67‎ Added {{lead rewrite}} and {{technical}} tags to article (TW) undo

17 May 2017

• curprev 14:5114:51, 17 May 2017‎ VaGent64 talk contribs‎ m 8,403 bytes +396‎ Added citation undo Tag: Visual edit
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5 June 2016

• curprev 15:3315:33, 5 June 2016‎ Dcirovic talk contribs‎ m 7,176 bytes +63‎ →‎Bibliography: refs using AWB undo

23 December 2015

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23 August 2015

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21 May 2015

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22 June 2014

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20 June 2014

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16 January 2014

• curprev 03:0203:02, 16 January 2014‎ Mark Arsten talk contribs‎ 6,734 bytes −4‎ Removing link(s) to "Material": deleted via Afd. (TW) undo

14 January 2014

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15 July 2013

• curprev 15:2615:26, 15 July 2013‎ Dewritech talk contribs‎ 6,736 bytes +10‎ clean up, typos fixed: Accellerated → Accelerated using AWB undo

3 April 2013

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19 March 2013

• curprev 20:4820:48, 19 March 2013‎ Addbot talk contribs‎ m 6,610 bytes −33‎ Bot: Migrating 1 interwiki links, now provided by Wikidata on d:q7310987 undo

9 March 2013

• curprev 15:2415:24, 9 March 2013‎ Meredyth talk contribs‎ m 6,643 bytes +34‎ →‎Mechanically induced failure mechanisms: Repairing links to disambiguation pages - You can help! undo

19 October 2012

• curprev 20:1620:16, 19 October 2012‎ Neil.steiner talk contribs‎ m 6,609 bytes −8‎ Removed redundant word "bonding". undo

14 October 2012

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23 April 2012

• curprev 23:3723:37, 23 April 2012‎ PKT talk contribs‎ 6,617 bytes +12‎ Disambiguated: metallization → metallizing undo

19 February 2012

• curprev 13:0113:01, 19 February 2012‎ New Light Taiwan talk contribs‎ 6,605 bytes +83‎ →‎See also: add wiki internal links to assist in knowing the tools and resources for examining materials and devices after reliability stress cycles. undo

10 February 2012

• curprev 07:0407:04, 10 February 2012‎ R. S. Shaw talk contribs‎ 6,522 bytes 0‎ usage:, replaced: factors effecting → factors affecting using AWB undo

18 January 2011

• curprev 14:5214:52, 18 January 2011‎ Wosch21149 talk contribs‎ 6,522 bytes +46‎ Changed reference format (first linked reference on this page...) undo
• curprev 14:3814:38, 18 January 2011‎ Wosch21149 talk contribs‎ 6,476 bytes +309‎ Added stress tests in qualification phase and reference to AEC Q100/Q101 undo

22 November 2010

• curprev 11:1711:17, 22 November 2010‎ Abc eagle talk contribs‎ 6,167 bytes +33‎ Add link to Chinese page undo

26 October 2010

• curprev 17:3117:31, 26 October 2010‎ Mortense talk contribs‎ m 6,134 bytes +3‎ Copy edit. undo

11 April 2010

• curprev 22:3522:35, 11 April 2010‎ Daniel dulay talk contribs‎ 6,131 bytes −8‎ →‎References undo